The first in its category to boast four quads, the NexION® 5000 multi-quadrupole ICP-MS is innovatively designed to meet and exceed the demanding requirements of ultra-trace elemental applications. It delivers exceptionally low background equivalent concentrations and outstanding detection limits, key to ensuring accurate, repeatable results. Plus, it provides superior interference removal, phenomenal stability and unmatched matrix tolerance, for results you can count on. Discover how the NexION 5000 takes ICP-MS performance beyond traditional triple quad.
In addition to boasting four quads, the NexION 5000 is also the proud recipient of three awards: Wiley Analytical Science Award, The Analytical Scientist Innovation Award, and R&D 100 Award.
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The NexION 5000 Cleanroom ICP-MS is suitable for cleanroom applications, designed specifically for those requiring the highest level of cleanliness and the lowest background equivalent concentrations (<1 ppt, even in hot plasma). It is equipped with a host of new and proprietary technologies which together surpass traditional triple-quad capabilities and redefine your expectations:
| Depth | 85.0 cm |
|---|---|
| Height | 85.0 cm |
| Model Name | NexION 5000 Cleanroom ICP-MS |
| Product Brand Name | NexION |
| Technology Type | Multi-Quad ICP-MS for Cleanroom Applications |
| Weight | 191.0 kg |
| Width | 114.0 cm |
Buffered oxide etchants (BOEs) are blends of hydrofluoric acid, ammonium fluoride, surfactants, and ultrapure water utilized in the semiconductor industry to etch thin films of silicon wafers. The reduction of potential contamination of silicon wafers during the etching process is crucial, as trace ...
Hydrofluoric acid (HF) is widely utilized in the semiconductor industry during the cleaning process of silicon wafers in order to reduce contamination by trace metals, particulates, and organic contaminants which would otherwise alter the functionality of the semiconductors. As such, the use of high ...
Nitric acid (HNO3) is widely utilized in the semiconductor industry during the cleaning process of silicon wafers to reduce contamination by trace metals, particulates, and organic contaminants which would otherwise alter the functionality of the semiconductors. As such, the use of a high-quality ac ...
Sulfuric acid (H2SO4) is used in the semiconductor industry to clean, etch impurities on silicon wafers and strip photoresist during the chip production processes. The reduction of potential contamination on silicon wafers is crucial, as trace-metal, particulate, and organic contaminants can alter t ...
Tetramethylammonium hydroxide (TMAH) is a basic solvent widely utilized in the semiconductor industry for photoresist development and lithography applications. The reduction of potential contamination on silicon wafers during the manufacturing processes is crucial as trace-metal, particulate and org ...
Since ultrapure water (UPW) is used throughout the semiconductor industry in a variety of applications, impurities need to be controlled as these will directly impact the quality and overall yield of semiconductor products. ICP-MS is often used to accurately quantify sub-ppt concentrations of impuri ...
Nitric acid is widely used throughout the semiconductor and electronics industry. Various purity grades are required depending on the application and the intended use. For this reason, the semiconductor industry has required ever-lower detection of a broad range of impurities, including non-metallic ...
As semiconductor manufacturing processes are being performed at increasing micro-levels, the demand for ICP-MS instrumentation capable of analyzing non-metallic elements at ultra-trace concentrations has grown. For these applications, the use of an ICP-MS system with a full-length resolving quadrupo ...
As semiconductor devices have become smaller and more sophisticated, it has become essential to prevent metal contamination, which causes yield loss. Therefore, strict impurity control is required for chemicals used in the fabrication process.
In partnership with Elemental Scientific Inc. (ESI), we’re delighted to bring to you a collection of application briefs for the fully-automated analysis of a variety of semiconductor-grade chemicals, seamlessly coupling the ESI prepFAST S ultraclean ...
Uranium-236 (236U) is the product of thermal neutron capture of 235U, but the natural occurrence of 236U is very rare. The presence of this isotope in a sample of uranium indicates that the sample originates from a nuclear reactor. Compared to naturally occurring uranium isotopes like 234U and 235U, ...
The late 20th century to early 21st century has been described as the Silicon Age, because of the large impact that elemental silicon (Si) has had on the world economy. Highly purified Si used in semiconductor electronics is essential in the production of transistors and integrated circuit chips use ...
Silicon (Si) is the most used semiconductor and is a critical element for producing circuits found in everyday electronics. As more industries utilize semiconductor devices and Si wafers in electronic products and services, there is an increasing demand for Si wafers with minimal impurities due to t ...
Metallic contamination in semiconductor products adversely affects device performance and impacts the yield of the fabrication process. To meet the demand for higher yields and performance in wafer substrates, contamination must be minimized on the wafer surface as well as in the substrate itself. T ...
Fine and specialized chemicals are used throughout the manufacturing process of semiconductor and electronic products, requiring strict control of impurities. Among these impurities, contaminants of inorganic nature can adversely affect device performance and impact the yield of the fabrication proc ...
Inductively coupled plasma mass spectrometry (ICP-MS) is an indispensable analytical tool in the semiconductor industry, since one of the most sensitive techniques for analyzing metallic impurities in chemicals. Most chemicals are analyzed with minimum dilution to determine ultra-trace levels of met ...
Semiconductor device fabrication utilizes a variety of chemicals, whose metallic impurity levels must remain at ultra-trace levels to ensure end product quality. Inductively coupled plasma mass spectrometry (ICP-MS) is one of the most sensitive techniques for metallic impurities testing and has beco ...
Contaminants in chemicals used during manufacturing processes have a direct impact on product yield and reliability of semiconductor devices. Within the whole process of integrated circuit manufacturing, wafers are sent for repeated cleaning using hydrogen peroxide (H2O2). Semiconductor Equipment an ...
For decades, the semiconductor industry has been designing new devices that are smaller, faster and consume less power than their predecessors. To maintain this trend, the critical features of these devices must also become smaller and have fewer defects. The small diameter of a chip’s features requ ...
During the production of semiconductor devices, it is crucial to ensure that the silicon wafers are free of contaminants and impurities. The use of high-purity chemicals during the cleaning process is critical to the semiconductor product’s overall quality and performance. Therefore, it is essential ...
In today’s fast-paced world, semiconductors have become indispensable. Demands for faster and smaller chips with higher integration and lower energy consumption are increasing. Potential sources of metallic contamination in semiconductor manufacturing processes are ubiquitous, thus it is critical to ...
Nickel-based superalloys are widely used in challenging environments because of their physical properties, which include, but are not limited to, toughness, high heat resistance, high strength-to-weight ratio, and low thermal conductivity. The required properties of state-of-the-art nickel-based sup ...
The production of electronic devices is a complex process that requires the use of ultra-pure chemicals during the manufacturing steps. High-purity-grade sulfuric acid (H2SO4) is generally used for cleaning components and etching all metal and organic impurities on silicon wafers. Impurities in sulf ...
As the limits of detection (LODs) for trace metal analysis are increasingly being pushed to the next decimal, a need exists to meet these new detection requirements without compromising accuracy or precision. Inductively coupled plasma mass spectrometry (ICP-MS) is often the technique of choice for ...
Newly regulated industries, such as cannabis, must deal with establishing standardized protocols with the prospect of regulations changing quickly and evolving as the industry expands. When establishing Sigma Analytical Services Inc. in 2017, a new company in a newly regulated industry with the inte ...
Article by Kieran Evans on researching and designing better batteries with the help of ICP-OES, ICP-MS, and FTIR Analytical methods in a laboratory setting
The NexION® 5000 multi-quadrupole ICP-MS won an R&D 100 Award, recognizing it as, “One of the 100 most technologically significant new products of the year in the analytical/test category.”
As the fundamental need to safeguard our environment continues to grow, and economic demand increases to support our growing population, it’s important to explore more sustainable avenues to ensure the long-term health of our planet at the same time as encouraging business and economic growth. Perki ...
This brochure guides you through all our PerkinElmer analytical solutions for the automotive industry. From advanced polymers and rubber materials, to batteries, semiconductors, glass, fuels and lubricants. See how we can offer you fully-rounded laboratory solutions along the whole automotive value ...
This brochure provides a simple guide to the analytical solutions and supporting services we provide for forensics and toxicology laboratories. We know it's not as simple as it seems in the movies, on television, or in the latest potboiler: forensic science is an exacting science, driven by the twin ...
It’s clear, glass has a variety of uses, from practical to technological to decorative. In particular, float glass is widely used in architecture, automotive, transportation, photovoltaic, and solar industries. For glass testing labs around the world, we offer highly accurate and tailored solutions ...
As the world moves to embrace renewable energy sources and reduce our global CO2 emissions, it will also be more dependent than ever on better battery technology, powering the demands of industries such as automotive, energy storage, and portable consumer goods like power tools, computers, and phone ...
In the fast-paced analytical world, accurate and reproducible results are essential to guaranteeing quality and ensuring safety. What many industries have in common is the need for trace-element analysis with superior interference removal, extremely low detection limits, and outstanding background e ...
The science and art of creating and maintaining thriving agricultural ecosystems requires cultivating healthy soil, crops and livestock. The safety and efficacy of agricultural chemicals and their uptake into our food supply requires robust, reliable and effective analytical testing on agrochemicals ...
Laboratories conducting trace-elemental analyses require high-performance instrumentation capable of delivering accurate and reproducible results, even at low concentrations. Find out how recent developments in multi-quadrupole ICP-MS technology address these evolving needs. Advantages: superior int ...
Quality control-monitoring and testing are important in ensuring the quality of palm oil. The quality control parameters are used to judge the quality of palm oil products and it can be monitored and tested to ensure that the palm oil is not deliberately or accidentally adulterated.
Perfect for your most challenging applications, the cutting-edge, multi-award-winning NexION® 5000 Multi-Quadrupole ICP-MS is the industry’s first and only four-quadrupole ICP-MS instrument – taking performance well beyond everyday triple-quad technology. And the scientific community is taking notic ...
Download this useful flyer for a summary of how our instrumentation can test for safety, performance and composition of your advanced battery materials. Get an overview of solutions and their benefits in materials characterization techniques from FT-IR, ICP-OES, ICP-MS, DSC, TGA, GC-MS and hyphenate ...
Download this Flyer for an overview of PerkinElmer's analytical solutions for the Semiconductor industry. This 2-page flyer outlines semiconductor and microelectronic workflows and applications, and the precise and reliable PerkinElmer solutions to address them - including instrumentation, consumabl ...
Today’s sustainable solutions are opening exciting new ways for businesses to fuel economic growth, while minimizing adverse impact on people and the planet. Laboratories are also working sustainability into their business plans to reduce downtime, waste, and costs – and in many cases, improve their ...
Atomic spectroscopy is a family of techniques for determining the elemental composition of an analyte by its electromagnetic or mass spectrum. Several analytical techniques are available: Atomic absorption (AA): flame and graphite furnace Inductively coupled plasma optical emission spectroscopy (ICP ...
This guide offers an overview of analyses required throughout the battery value chain - learn about innovative analytical solutions for testing every part of the battery, including the anode, cathode, binder, separator, and electrolyte. See the value in data generated from a variety of applications ...
This document provides information to assist in preparing your laboratory for the PerkinElmer NexION® 5000 ICP-MS system prior to instrument delivery and installation.
Accurate, reproducible trace elemental analysis is essential to ensuring the quality and safety of our products and our environment, and the award-winning NexION® ICP-MS platform delivers that level of accuracy and repeatability through a host of unique features that provide superior interference re ...
Whether looking for sample introduction components or standards, we have the consumables you need to keep your NexION up and running smoothly and efficiently.
This nanometrology portfolio infographic poster gives you a 1-page overview of the instrumentation required by laboratories for the investigation of nanomaterials which are used to develop advanced materials in a range of applications.
We are supporting scientists as they work to solve the battery challenges that will drive the next phases of global economic advancement as the world pivots towards a renewable energy future.
Download this poster for an all-in-one view of how PerkinElmer instrumentation can answer the analytical needs of the solar market. From R&D of nanomaterials and advanced materials to solar cell component testing including aging and defect analysis - our UV/Vis, DSC, TGA, FT-IR and ICP systems help ...
Our High Throughput System (HTS) is a uniquely designed modular sample introduction that integrates with the NexION® series of ICP-MS and the Avio® series of ICP-OES to dramatically reduce sample-to-sample time, thereby improving sample throughput while maintaining operation simplicity. The HTS maxi ...
The NexION® 5000 is a multi-quadrupole-based ICP-MS instrument engineered to remove the most complex interferences, ideal for multi-element analysis applications requiring ultra-trace-level detection. Download this product note to discover all of its innovative features.
Syngistix™ for ICP-MS software for the NexION® ICP-MS instruments is designed to improve efficiencies in the laboratory. It features a refreshed user interface that conforms to your workflow, delivering a modern, streamlined experience based on familiar left-to-right navigation and a ribbon menu, wi ...
Product Certificate for the Nexion 5000
PerkinElmer’s All Matrix Solution (AMS) system provides a number of benefits to simplify analysis of high-matrix samples with the NexION family of ICP-MS instruments. It allows online gas dilution, improving efficiency and preventing contamination, delivering up to 200x dilution and the ability to s ...
Interferences will always occur in ICP-MS and need to be dealt with. However, the NexION® 5000 multi-quadrupole ICP-MS with quadrupole Universal Cell is able to effectively and reproducibly remove spectral interferences leading to improved accuracy, repeatability and reproducibility, while solving p ...
The innovative design of the second-generation Triple Cone Interface with patent-pending OmniRing™ was developed for the NexION® 2200 and 5000 ICP-MS systems with both sensitivity and stability in mind. It builds on the Triple Cone Interface geometry of the NexION series and provides unique solution ...
The NexION® 5000 ICP-MS, with multi-quadrupole technology and Universal Cell, is able to take full advantage of element reactivity with 100% pure gases by analyzing them as cluster ions at higher masses where no interferences reside, and the background is clean. The Universal Cell, thanks to its qua ...
TotalQuant, a software feature unique to PerkinElmer's NexION® ICP-MS systems, intelligently interprets the complete mass spectrum, providing semi-quantitative to quantitative results for all elements. TotalQuant and survey scan can provide supplementary and confirmatory information about unknown sa ...
Interferences in plasma-based spectroscopy are among the most challenging aspects of method development for ICP-MS analysis. When complex matrices are present, polyatomic and isobaric interferences can lead to inaccurate and inconsistent results.
PerkinElmer’s All Matrix Solution, available on all NexION® ICP-MS instruments, allows online gas dilution of your samples, both improving efficiency and preventing contamination.
Syngistix™ for ICP-MS software for the NexION® ICP-MS series instruments is designed with your workflow in mind to make it easy for you to set up and report your analyses, upleveling your experience.
PerkinElmer is empowering sustainability for a range of global industries including renewable energy, batteries and energy storage.
Take a look at the exciting initiative that Colorado State University is leading: The Periodic Table of Food database.
In this on-demand presentation video, Jess Liu of NewFast Technology talks about trace contaminant detection in chip (silicon wafer) manufacturing.
In this webinar we will examine the power of PerkinElmer's latest in the NexION Series of ICP-MS: the NexION 5000 multi-quadrupole ICP-MS.
Our atomic spectroscopy experts have complied a series of Atomic Spectroscopy Webinars to walk through the fundamentals and theory of AA, ICP-OES and ICP-MS analysis.
With the increasing demand for high-specification electronic devices, the discovery of rare earth elements (REEs) has become crucial.
Rechargeable high-performance battery technology is enabling the large-scale e-mobility revolution.
In semiconductor fabrication, it is imperative to be able to control impurities in specialty gases, as otherwise they will lead to unwanted formation of deposits on the wafer surface
We all know Chips are essential for a host of day to day products which need memory and operating semiconducting chips in their manufacture - from phones to cars, to commercial and industrial equipment.
Disruptions in ocean chemistry can lead to algal blooms which can pose a risk to wildlife.
Syngistix™ software for NexION® ICP-MS instruments provides several different ways of data acquisition, depending on analysis needs and desirable results.
Syngistix™ software for NexION® ICP-MS instruments provides several different ways of data acquisition, depending on analysis needs and desirable results.
