Near Infrared Reflectance Module (NIRM) for Spectrum Two N FT-NIR | PerkinElmer
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Near Infrared Reflectance Module (NIRM) for Spectrum Two N FT-NIR

The Near Infrared Reflectance Module for the Spectrum Two N FT-NIR provides a convenient and sensitive method for analyzing opaque or highly scattering solid samples such as pharmaceuticals, food products, soap powders, coal, clay, soil, paper, painted surfaces, polymer foam, and catalysts.

Part Number L1390205
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Overview

The Near-Infrared Reflectance Module (NIRM) is used for collecting diffuse reflectance spectra of solids, granules, pastes, powders and turbid liquids. Clear liquids can also be analyzed using the liquids transflectance accessory. Diffuse reflectance is a non-destructive technique allowing for both qualitative and quantitative measurement.

The NIRM has been specifically designed to give excellent reproducibility when the same analysis is performed using a number of different spectrometer and accessory combinations. This has been achieved by:

Due to its non-destructive nature, near infrared diffuse reflectance is useful for a wide range of samples, from emulsions and powders to tablets. For many types of samples, no preparation is required. Samples can be scanned through a beaker or plastic bag, and tablets can be scanned while still in the blister pack. An optional Sample Vial Holder attachment, allowing for multiple sizes of vials, is also available to securely hold and align vials on the sample window to ensure reproducible reflectance measurements.

A range of Petri dishes and vials are available from PerkinElmer that can be either placed directly on the NIRM top plate or (in the case of the Petri dishes) used with the optional Sample Spinner. The optional Sample Spinner allows for representative sampling of non-homogenous samples and is particularly suited for samples with particles sizes exceeding 1 mm. The Sample Spinner reduces the effect of sample orientation, inhomogeneity, and re-pack.

  • Designing an optical system of high uniformity and consistency, so that the positioning of the sample has a negligible effect on the spectrum
  • Rapidly collecting alternate measurements of sample and an internal reference material throughout the scanning of sample spectra to eliminate the effect of drift
  • Minimizing the amount of stray light entering the detector, and correcting for the effect of any stray light that is measured
  • Introducing a reference correction to standardize the internal reference material of the NIRM against a chosen reference material.

Specifications

Product Brand Name Spectrum Two N
Product Group NIRM Accessory
Technology Type Diffuse Reflectance
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Near Infrared Reflectance Module (NIRM) for Spectrum Two N FT-NIR Near Infrared Reflectance Module (NIRM) for Spectrum Two N FT-NIR
Near Infrared Reflectance Module (NIRM) for Spectrum Two N FT-NIR Near Infrared Reflectance Module (NIRM) for Spectrum Two N FT-NIR
Near Infrared Reflectance Module (NIRM) for Spectrum Two N FT-NIR Near Infrared Reflectance Module (NIRM) for Spectrum Two N FT-NIR
Near Infrared Reflectance Module (NIRM) for Spectrum Two N FT-NIR
Near Infrared Reflectance Module (NIRM) for Spectrum Two N FT-NIR
Near Infrared Reflectance Module (NIRM) for Spectrum Two N FT-NIR