Total Absolute Measurement System (TAMS) | PerkinElmer
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Total Absolute Measurement System (TAMS)

The most flexible platform of its kind, the Total Absolute Measurement System (TAMS) unit allows you to choose the right detector for angular-dependent measurements of optical properties of thin and thick samples, using a concentric rotation stage for sample and detector. Used with the LAMBDA 850+ and 1050+ UV/Vis/NIR spectrometers, the improved TAMS system allows the use of multiple types of detectors depending upon the sample type and application.

Part Number L6310240
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Overview

Whatever detector you choose, TAMS maintains the highest accuracy with the widest wavelength range for angle-dependent measurement. Commonly used in the analysis of glazing found on architectural and automotive glass as well as photovoltaic cells in the solar industry, TAMS is a useful addition to any production lab tasked with the measurement of transmission and absolute reflectance at variable angles.

  • Fully automated goniometer design capable of measuring bi-directional reflectance and transmittance and angular resolved scattering
  • The accessory occupies the detector compartment only
  • Separate detectors for reference and sample beam, both can be exchanged by the operator for other detector modules that are optimized for different applications
  • Angular resolution 0.01° for both sample and detector stages
  • Angular accuracy 0.02° degrees for both sample and detector stages
  • Angular range sample stage +/- 180°
  • Angular range detector stage 15° – 345°
  • Angular range in reflectance 7.5° – >80°, depending on sample size
  • Angular range in transmittance 5° – >80°, depending on sample size (sample – detector inter-reflections occur for angles < 5° that compromises the accuracy)
  • Sample size up to 150 x 150 mm with the standard sample holder (200 mm x 180 mm with other means)
  • 200 mm Rotating sample platform with M5 screw holes on a 25mm x 25mm grid

Applications

  • Absolute measurement of directional Reflectance and transmittance
  • BRDF/ BTDF measurements

Unique flexible detector sets

For each application you can choose the best detector set.

  • Sphere Detectorsets for maximum accuracy (to capture all additional beams from for example thick and slightly curved samples
  • Standard Detectorsets for maximum sensitivity (BRDF/BTDF an scattering measurements)

Autosampler

The TAMS autosampler (fully automated and integrated in TAMS user interface) is capable of performing measurements on a 6 inch wafer at different positions when installed in a TAMS accessory Multisampling is possible by placing a holder for 19 x 1 inch samples or 5 x 2 inch sample. You can also design your own holder into the autosampler.

Specifications

Technology Type UV/VIS
Resources, Events & More
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Application Note

The Use of UV/Vis/NIR Spectroscopy in the Development of Photovoltaic Cells

UV/Vis/NIR spectroscopy is used to study the optical properties of photovoltaic cells. The various phenomena involved (reflectance, transmittance, absorbance) are considered along with the equipment required to measure them. The study is based on a silicon cell and involves calculations to determine ...

PDF 1 MB

Brochure

Comprehensive and Compliant Solutions for Glass Analysis

It’s clear, glass has a variety of uses, from practical to technological to decorative. In particular, float glass is widely used in architecture, automotive, transportation, photovoltaic, and solar industries. For glass testing labs around the world, we offer highly accurate and tailored solutions ...

PDF 2 MB
LAMBDA 1050+ Interactive Brochure

The demand for smart materials with advanced properties for improved safety, efficiency and functionality is rapidly growing. Accurate characterization of a wide-range of sample materials is critical for manufacturers and researchers developing products to ensure their performance meets exacting reg ...

PDF 6 MB

Flyer

High-End UV-VIS-NIR Solutions in Advanced Materials Testing Flyer

Advanced optical materials, nanomaterials, and manmade chemicals can go a long way toward addressing the most vexing issues of our day. In materials testing, there’s sometimes a need to characterize complex samples, such as laser protection lenses, architectural glasses, optical filters, and anti-re ...

PDF 511 KB

Webinars

Advance Coatings Research with UV-Vis-NIR analysis and MappIR, for applications in Optoelectronics, Photovoltaics and Semiconductors

This webinar explores the principles, technology and applications of UV-Vis & FTIR analyses for the characterization of materials in semiconductors, photovoltaics and optoelectronics.

Webinars

White Paper

Major Considerations in Choosing a High-Performance UV/Vis or UV/Vis/NIR System

UV/Vis and UV/Vis/NIR spectroscopy are well established analytical techniques being effectively applied across a wide range of industries. High-performance UV/Vis spectroscopy has expanded into new applications, especially in the life sciences. At the same time, in traditional application areas such ...

PDF 1 MB