Introduction
ICP-OES is a rugged analytical technique capable of handling complex sample matrices with minimal adjustments to sample introduction components, enabling accurate measurements at parts-per-billion levels. However, some elements—including arsenic, lead, mercury, phosphorus, selenium, and thallium—produce relatively weak emission signals. As a result, achieving accurate and repeatable measurements below 20 ppb can be challenging. A key reason is that many of these elements emit their primary or secondary spectral lines in the low ultraviolet region of the spectrum, typically below 220 nm.
UV Boost mode on the Avio® 3000 ICP-OES opens new possibilities for the analysis of elements with emission lines lower than 243 nm. The increased sensitivity allows accurate measurements at lower concentrations, both in normal and high resolution modes, and permits the use of secondary emission lines which normally do not have enough intensity to be useful. The power of UV Boost mode is that it amplifies the potential of ICP-OES analyses.
Download this technical note to learn more about the unique benefits of UV Boost mode on the Avio 3000 ICP-OES.
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